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Date: 2012-11-06 11:44:32Electronic engineering Electromagnetism Electronics Integrated circuits Electronic design automation Electronic design Semiconductor device fabrication Hardware Trojan Automatic test pattern generation Electromigration Reliability engineering Negative-bias temperature instability | Copyright © 2012 American Scientific Publishers All rights reserved Printed in the United States of America Journal of Low Power ElectronicsAdd to Reading ListSource URL: euler.ecs.umass.eduDownload Document from Source WebsiteFile Size: 2,22 MBShare Document on Facebook |
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