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Spectroscopy / Optical devices / Monochromator / Beamline / Grating / Diffraction / Insertion device / Synchrotron / Canadian Light Source / Physics / Particle accelerators / Electromagnetic radiation


The PolLux Microspectroscopy Beamline at the Swiss Light Source U. Flechsig∗ , C. Quitmann∗ , J. Raabe∗ , M. Böge∗ , R. Fink† and H. Ade∗∗ ∗ †
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Document Date: 2012-05-23 08:04:22


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City

Mellville / Berlin / Erlangen / /

Company

I. McNulty S. P. / /

Country

Germany / United States / /

Facility

North Carolina State University / American Institute of Physics / /

IndustryTerm

photon energy range / extended energy range / insertion device / energy / /

Organization

American Institute / Department of Physics / North Carolina State University / Raleigh / Paul Scherrer Institut / /

Person

Ray Microscope / Ray Microscopy / Ray Microfocusing / Paul Scherrer / /

ProgrammingLanguage

R / /

ProvinceOrState

North Carolina / New York / /

PublishedMedium

Review of Scientific Instruments / Applied Physics Letters / Proceedings of SPIE / /

Technology

spectroscopy / Radiation / x-ray / /

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