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Statistics / Measurement / Noise / Natural process variation / Quality control / Process corners / Effective number of bits / Electromagnetism / DBc / Digital signal processing / Electronics / Integrated circuits


Berkeley Design Automation Statistical Process Corners for Nm-Scale AMS GSA AMS Working Group November 14, 2012
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Document Date: 2014-01-22 10:43:04


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Berkeley Design Automation / TSMC / Foundry / /

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General Services Administration / /

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ADC / CMP / simulation / /

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