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 Date: 2012-12-26 11:31:52Chemistry Mass spectrometry Time-of-flight mass spectrometry Electron affinity Ion trap Ion source |
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| First Page | Document Content | |
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Date: 2012-12-26 11:31:52Chemistry Mass spectrometry Time-of-flight mass spectrometry Electron affinity Ion trap Ion source |
Add to Reading List |
THE JOURNAL OF CHEMICAL PHYSICS 137, Slow photoelectron velocity-map imaging spectroscopy of cold negative ions Christian Hock, Jongjin B. Kim, Marissa L. Weichman, Tara I. Yacovitch, and Daniel M. Neumark