| Document Date: 2010-05-21 09:39:41
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Company PROBE BASED MEASUREMENT SOLUTIONS / Obayashi / Agilent / Advanced Millimeter-Wave Technologies / / Country Germany / / / Facility Thomas Zwick Karlsruhe Institute of Technology / / IndustryTerm measurement equipment / measurement solutions / wireless applications / semiconductor chip / metal parts / Wireless Propagation Letters / / Organization Antenna Measurement Techniques Association / US Federal Reserve / Institute of Technology / / Person Thomas Zwick / K. Van Caekenberghe / / Position probe head / / Technology Radiation / Microwave / radio frequency / mems / coaxial cable / simulation / 3-D / semiconductor chip / dielectric / /
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Probe Based Radiation Pattern Measurements for Highly Integrated Millimeter-Wave Antennas