Back to Results
First PageMeta Content
Structural system / Scanning probe microscopy / Nanotechnology / Cantilever / Surface chemistry / Atomic force microscopy / Surface stress / Deflection / Piezoresistive effect / Chemistry / Science / Physics


Cantilever Sensors: Nanomechanical Tools for Diagnostics Ram Datar, Seonghwan Kim, Sangmin Jeon,
Add to Reading List

Document Date: 2011-02-10 14:18:36

Open Document

File Size: 434,43 KB

Share Result on Facebook

City

Meyer / Hensen / Hansen / /

Company

Oak Ridge National Laboratory / /

Continent

North America / Europe / /

Facility

Georgia Institute of Technology / Massachusetts Institute of Technology / /

IndustryTerm

surface energy density / free energy change / free energy / gold/titanium metal leads / metal oxide semiconductor / microfabrication technology / e-beam / surface free energy / biodetection applications / healthcare / carrier mobility / /

Organization

Georgia Institute of Technology / Massachusetts Institute of Technology / /

Person

Anja Boisen / Scott Manalis / Y. Arntz / Sangmin Jeon / Ram Datar / H. Tark / V / P.J. Williams / V / Nano / Seonghwan Kim / Peter Hesketh / C.L. Britton Jr. / Thomas Thundat Abstract Cantilever / Stoney / /

Position

V.P. / /

ProvinceOrState

New Mexico / South Carolina / Georgia / Massachusetts / /

Technology

semiconductor / single nucleotide polymorphism / biomaterials / antibodies / hybridization / SNP / field-effect transistor / microfabrication technology / DNA hybridization / Biosensing technologies / /

URL

www.cancer.gov / www.mrs.org/bulletin / /

SocialTag