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Analytical chemistry / Time-of-flight mass spectrometry / Reflectron / Delayed extraction / Time of flight / Chemical ionization / Ion / Matrix-assisted laser desorption/ionization / Static secondary-ion mass spectrometry / Chemistry / Mass spectrometry / Laboratory techniques


Koichi Tanaka - Nobel Lecture
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Document Date: 2006-05-31 16:47:59

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City

Kyoto / /

Company

KOICHI TANAKA Shimadzu Corporation / Shimadzu Corporation / /

Country

Germany / Japan / United States / /

IndustryTerm

spatial and kinetic energy distributions / ionization technologies / kinetic energy / chemical ionization / analytical instrument manufacturer / potential energy / kinetic and potential energy / optical energy / ionization technology / activation energy / gas phase / increased internal energy / energy / /

Organization

Japan Patent Office / /

Person

Boris Mamyrin / Tamio Yoshida / Ian McLaren / Frank Field / Yutaka Ido / Yoshikazu Yoshida / Franz Röllgen / Satoshi Akita / William Wiley / Louis Friedman / Don Hunt / Mamoru Ohashi / Burnaby Munson / Robert Cotter / /

Position

specialist / /

ProvinceOrState

Mississippi / /

Technology

LASER / ADC / MEASUREMENT TECHNOLOGY / S/N / ION DETECTION TECHNOLOGY / RAPID HEATING TECHNOLOGY / Reflectron technology / TOF technology / ionization technologies / ionization technology / /

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