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Optics / X-ray telescopes / Plasma physics / Radiography / X-ray astronomy / Chandra X-ray Observatory / Encircled energy / Point spread function / X-ray optics / Astronomy / Electromagnetic radiation / Observational astronomy


Orbital measurement and verification of the Chandra X-Ray Observatory’s PSF D. Jerius, R.H. Donnelly, M.S. Tibbetts, R.J. Edgar, T.J. Gaetz, D.A. Schwartz, L.P. Van Speybroeck, P.Zhao Smithsonian Astrophysical Observat
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Document Date: 2005-04-01 18:12:46

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City

Huntsville / Austin / /

Company

Dell / R.J. Edgar L.P. / ADASS VI A.S. / Hughes Danbury Optical Systems / A.S.P. / Eastman Kodak Co. / D.A. Schwartz L.P. / P.P. Plucinsky L.P. / TRW / Optical Coating Laboratory Inc / Fitch Ratings Ltd. / /

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Event

Credit Rating / /

Facility

P.Zhao Smithsonian Astrophysical Observatory / Chandra X-Ray Observatory / X-Ray Calibration Facility / Marshall Space Flight Center / Chandra Observatory / INTRODUCTION The Chandra X-Ray Observatory / /

IndustryTerm

imaged energy / encircled energy data / spectral energy distribution / encircled energy function / energy sensitivity / detector systems / encircled energy diameters / increased incident energy / energy dependent characteristics / encircled energy / aspect solution / encircled energy measurement / encircled energy measurements / important tool / energy results / energy / /

MusicGroup

Instruments / X-Ray / /

Organization

Society of Photo-Optical Instrumentation Engineers / Marshall Space Flight Center / HRMA PSF / National Aeronautics and Space Administration / High Resolution Mirror Assembly / Smithsonian / /

Person

D. Jerius / D. Dewey / Joachim E. Tr / P. Van Speybroeck / Bernd Aschenbach / N.S. Schulz / /

Position

editor / D.J. / H.L. Marshall / /

ProvinceOrState

Alabama / /

Technology

X-Ray / Simulation System / simulation / /

URL

http /

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