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Chemistry / Semiconductor device fabrication / Mass spectrometry / Matter / Analysis / Materials science / Thin film deposition / Coatings / Sputtering / Secondary ion mass spectrometry / Ion beam / Semiconductor


One-dimensional carrier profiling of blanket and confined semiconducting structures Promoter: Prof. Dr. Ir. W. Vandervorst Contact and daily advisor: Dr. Ir. J. Bogdanowicz () Required backgroun
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Document Date: 2016-06-08 02:28:36


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File Size: 65,03 KB

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