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Science / Secondary ion mass spectrometry / Sputtering / Ion beam / Static secondary-ion mass spectrometry / Sensitive high-resolution ion microprobe / Chemistry / Mass spectrometry / Scientific method


BOOK REVIEWS SECONDARY ION MASS SPECTROMETRY IN THE EARTH SCIENCES* The Mineralogical Association of Canada Short Course Series Volume 41, Secondary Ion Mass Spectrometry in the Earth Sciences – Gleaning the
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Document Date: 2010-04-14 07:53:24


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Toronto / Paris / /

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France / /

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USD / /

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University of Manitoba / Memorial University of Newfoundland / University of Alberta / University of California / University of Wisconsin / Arizona State University / /

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chemical conditions / physical-chemical process / chemical compositions / ion imaging / chemical composition / analytical solutions / geological applications / light-element isotopic systems / isotopic systems / chemical gradients / energy filtering / Chemical pretreatments / review oxygen isotope applications / important tool / helpful tool / /

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John Valley / /

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IAH / GAC / CGU / Virginia Tech / Arizona State University / Memorial University of Newfoundland / Mineralogical Association of Canada Short Course Series Volume / University of California / Los Angeles / Mineralogical Association of Canada Short Course Volume / University of Manitoba / University of Alberta / MAC / Joint Assembly of AGU / University of Wisconsin / /

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ION MASS SPECTROMETRY / Graham Layne / Mostafa Fayek / Jerry Hunter / Richard Stern / George Slodzian / Axel Schmitt / Raimond Castaing / Noriko Kita / /

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Alberta / Wisconsin / Manitoba / Newfoundland / California / Ontario / /

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semiconductor / /

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