Back to Results
First PageMeta Content
Ions / Thin film deposition / Mass spectrometry / Ion source / Semiconductor device fabrication / Ion beam / Electron / Ion gun / Static secondary-ion mass spectrometry / Chemistry / Physics / Scientific method


OXFORD APPLIED RESEARCH Low Energy Ion Source- LIon50 Specimen cleaning, Ion spectroscopy. 30eV - 1keV
Add to Reading List

Document Date: 2015-04-23 17:42:59

Open Document

File Size: 162,85 KB

Share Result on Facebook

Company

Oxford Applied Research Ltd. / Oxford Applied Research USA / /

Country

United Kingdom / /

/

Facility

sales@oaresearch.co.uk OXFORD APPLIED RESEARCH Crawley Mill / /

/

IndustryTerm

beam energy / ion-beam energy / beam energy 30eV / beam energy dependent / low energy gas ion source / narrow energy / energy / /

Person

Ion Beam / /

/

Technology

spectroscopy / /

SocialTag