22 nanometer

Results: 25



#Item
1Small-scale Tests for Identifying Explosivity Jimmie C. Oxley; James L. Smith; Patrick R. Bowden; Ryan Rettinger University of Rhode Island; Technical Approach

Small-scale Tests for Identifying Explosivity Jimmie C. Oxley; James L. Smith; Patrick R. Bowden; Ryan Rettinger University of Rhode Island; Technical Approach

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Source URL: www.northeastern.edu

Language: English - Date: 2012-07-09 10:15:50
2Statistical variability shapes the future of CMOS Keynote talk from the CEO of GSS at the DATE VAMM Workshop The CEO of Gold Standard Simulations, Professor Asen Asenov, will deliver a keynote talk on variability in emer

Statistical variability shapes the future of CMOS Keynote talk from the CEO of GSS at the DATE VAMM Workshop The CEO of Gold Standard Simulations, Professor Asen Asenov, will deliver a keynote talk on variability in emer

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Source URL: goldstandardsimulations.com

Language: English - Date: 2012-02-08 08:24:14
3INVESTOR MEETING 2014 William Holt Executive Vice President General Manager, Technology and Manufacturing Group  Key Messages from 2013

INVESTOR MEETING 2014 William Holt Executive Vice President General Manager, Technology and Manufacturing Group Key Messages from 2013

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Source URL: intelstudios.edgesuite.net

Language: English - Date: 2014-11-20 13:56:32
4HC19Panel - What's Next Beyond CMOS? Shahidi_HOT_Rump V3.ppt

HC19Panel - What's Next Beyond CMOS? Shahidi_HOT_Rump V3.ppt

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Source URL: www.hotchips.org

Language: English - Date: 2013-07-27 23:59:50
5Microsoft PowerPoint - CAT_Program_Overview_7-24-09_V5

Microsoft PowerPoint - CAT_Program_Overview_7-24-09_V5

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Source URL: www.iarpa.gov

Language: English - Date: 2014-03-06 18:49:28
6Intel Corporation 2200 Mission College Blvd. P.O. Box[removed]Santa Clara, CA[removed]Fact Sheet

Intel Corporation 2200 Mission College Blvd. P.O. Box[removed]Santa Clara, CA[removed]Fact Sheet

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Source URL: download.intel.com

Language: English - Date: 2011-08-04 14:31:47
7Circuit Analysis Tools (CAT) Developing tools that keep pace with Moore’s Law scaling Program Manager: Dr. Carl McCants; E-mail: [removed] Microelectronics designs are advancing faster than our capacity to

Circuit Analysis Tools (CAT) Developing tools that keep pace with Moore’s Law scaling Program Manager: Dr. Carl McCants; E-mail: [removed] Microelectronics designs are advancing faster than our capacity to

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Source URL: www.iarpa.gov

Language: English - Date: 2014-11-12 08:33:33
81  Table FEP1 Front End Processes Difficult Challenges

1 Table FEP1 Front End Processes Difficult Challenges

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Source URL: public.itrs.net

Language: English - Date: 2014-03-27 11:42:22
9INTERNATIONAL TECHNOLOGY ROADMAP FOR SEMICONDUCTORS[removed]EDITION

INTERNATIONAL TECHNOLOGY ROADMAP FOR SEMICONDUCTORS[removed]EDITION

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Source URL: public.itrs.net

Language: English - Date: 2014-03-27 14:06:28
10INTERNATIONAL TECHNOLOGY ROADMAP FOR SEMICONDUCTORS[removed]EDITION

INTERNATIONAL TECHNOLOGY ROADMAP FOR SEMICONDUCTORS[removed]EDITION

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Source URL: public.itrs.net

Language: English - Date: 2014-03-27 11:40:57