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Focused ion beam
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1	IEEE TRANSACTIONS ON MAGNETICS, VOL. 37, NO. 4, JULYMagnetic Properties of Fe Microstructures with Focused Ion Beam-Fabricated Nano-Constrictions Add to Reading List Source URL: science.komkon.org Language: English - Date: 2003-06-11 15:05:13
2	Physical Geography, 2013 Vol. 34, No. 3, 159–173, http://dx.doi.orgVarnish microlaminations: new insights from focused ion beam preparation David Krinsleya, Jeffrey Dittob, Kurt Langworthy Add to Reading List Source URL: alliance.la.asu.edu - Date: 2013-09-02 23:50:44
3	Nano Wired V O L U M E NREC MISSION  Add to Reading List Source URL: nnrc.eng.usf.edu Language: English - Date: 2011-06-23 18:14:49 Electron microscopy Nanotechnology Materials science Chemistry Learning Electron beam Microtechnology Carnegie Mellon University National Robotics Engineering Center Electron microscope Microelectromechanical systems Focused ion beam
4	SCANNING VOL. 33, 78–) & Wiley Periodicals, Inc. Investigation of Tibetian Plateau Varnish: New Findings at the Nanoscale Using Focused Ion Beam and Transmission Electron Microscopy Techniques Add to Reading List Source URL: alliance.la.asu.edu Language: English - Date: 2011-05-20 18:17:10 Electron microscopy Scientific method Learning Chemistry Focused ion beam Scanning electron microscope Electron microscope Transmission electron microscopy Microscope Scanning transmission electron microscopy Microscopy Characterization
5	Precambrian Research–54 Focussed ion beam preparation and in situ nanoscopic study of Precambrian acritarchs Andr´e Kempe a,1 , Richard Wirth b , Wladyslaw Altermann c,∗ , Robert W. Stark a , J. Willi Add to Reading List Source URL: www.nano-science.de Language: English - Date: 2006-01-11 10:38:50 Electron microscopy Microscopes Raman scattering Scanning probe microscopy Intermolecular forces Transmission electron microscopy Atomic-force microscopy Scanning electron microscope Electron microscope Microscopy Raman microscope Focused ion beam
6	Laser cooled cesium atoms as a focused ion beam source Matthieu Viteau Orsay Physics, 95 avenue des Monts Auréliens, Fuveau, France FIB (Focused Ion Beam) technology is an essential tool in many fields such as semicondu Add to Reading List Source URL: www.ino.it Language: English - Date: 2013-02-06 06:59:57 Ion source Semiconductor device fabrication Thin film deposition Ions Accelerator physics Focused ion beam Liquid metal ion source Ion beam Gallium Ion Plasma Fib
7	ENHANCE – MC-ITN European Research Training Network of New Materials: Innovative Concepts for their Fabrication, Integration and Characterization Workshop WS-7. Nanostructuring methods utilising electron & ion beam pro Add to Reading List Source URL: www.enhance-itn.eu Language: English - Date: 2012-08-26 06:50:01 Electron microscopy Nanotechnology Microtechnology Semiconductor device fabrication Electron beam Electron beam-induced deposition Electron microscope Microfabrication Scanning electron microscope Photolithography Focused ion beam
8	Natural experiments in landscape evolution Add to Reading List Source URL: alliance.la.asu.edu Language: English - Date: 2010-10-14 21:45:46 Ceramic materials Ceramic glazes Deposition Desert varnish Rocks Sedimentology Glass Varnish Silicon dioxide Focused ion beam
9	EXTERNAL CHARGES FOR EQUIPMENT IN THE GRADUATE CENTER FOR MATERIALS RESEARCH Add to Reading List Source URL: amcl.mst.edu Language: English - Date: 2016-02-25 17:45:59 Electron microscopy Scientific method Learning Chemistry Focused ion beam Microscope Scanning electron microscope Transmission electron microscopy Electron microscope Microscopy Atomic-force microscopy
10	Paper Formatting Instructions - Mo Add to Reading List Source URL: www.rertr.anl.gov Language: English - Date: 2015-11-06 10:40:28 Nuclear technology Nuclear chemistry Electron microscopy Nuclear physics Radiobiology Transmission electron microscopy Nuclear fuel Focused ion beam Nuclear fission product Burnup Fission products Electron microscope