High-k dielectric

Results: 66



#Item
1Hydrogen in high-k dielectric oxides modelled by muonium Rui Vilao - Univ. Coimbra Following the seminal work of Cox et al. (J. Phys. Cond. Matt) on high-k dielectric oxide muonics, we discuss the electro

Hydrogen in high-k dielectric oxides modelled by muonium Rui Vilao - Univ. Coimbra Following the seminal work of Cox et al. (J. Phys. Cond. Matt) on high-k dielectric oxide muonics, we discuss the electro

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Source URL: www.isis.stfc.ac.uk

Language: English - Date: 2016-06-18 18:17:09
    2F R A U N H O F E R I N S T I T U T e for I nte g rate d S y ste m s an d De v i c e T e c hno l o g y I I S B 1

    F R A U N H O F E R I N S T I T U T e for I nte g rate d S y ste m s an d De v i c e T e c hno l o g y I I S B 1

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    Source URL: www.iisb.fraunhofer.de

    Language: English - Date: 2015-06-08 12:47:04
    3

    PDF Document

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    Source URL: pfwww.kek.jp

    Language: English - Date: 2010-01-05 10:31:05
    4Photon Factory Activity Report 2005 #23Part BSurface and Interface 4C,6A,15C/2004G059  Residual Order in the Interfacial SiO2 Layer

    Photon Factory Activity Report 2005 #23Part BSurface and Interface 4C,6A,15C/2004G059 Residual Order in the Interfacial SiO2 Layer

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    Source URL: pfwww.kek.jp

    Language: English - Date: 2010-01-05 10:32:23
    5Photon Factory Activity Report 2009 #27 Part BSurface and Interface 18A/2008G186  Effect of oxygen coadsorption on titanium silicide formation on Si(001)

    Photon Factory Activity Report 2009 #27 Part BSurface and Interface 18A/2008G186 Effect of oxygen coadsorption on titanium silicide formation on Si(001)

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    Source URL: pfwww.kek.jp

    Language: English - Date: 2010-12-27 22:22:08
    6Surface and Interface  2C/2002S2-002 Chemical reaction and metallic cluster formation by annealing-temperature control in ZrO2 gate insulator on Si

    Surface and Interface 2C/2002S2-002 Chemical reaction and metallic cluster formation by annealing-temperature control in ZrO2 gate insulator on Si

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    Source URL: pfwww.kek.jp

    Language: English - Date: 2010-01-05 10:30:04
    7Photon Factory Activity Report 2010 #28 Part BSurface and Interface 2C/2008S2-003  Effect of nitrogen bonding states on dipole at the HfSiO/SiON interface studied by

    Photon Factory Activity Report 2010 #28 Part BSurface and Interface 2C/2008S2-003 Effect of nitrogen bonding states on dipole at the HfSiO/SiON interface studied by

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    Source URL: pfwww.kek.jp

    Language: English - Date: 2012-01-30 04:32:45
    8Photon Factory Activity Report 2006 #24 Part BSurface and Interface 2C/2005S2-002  Analysis of x-ray irradiation effect in high-k gate dielectrics by time-dependent

    Photon Factory Activity Report 2006 #24 Part BSurface and Interface 2C/2005S2-002 Analysis of x-ray irradiation effect in high-k gate dielectrics by time-dependent

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    Source URL: pfwww.kek.jp

    Language: English - Date: 2010-01-05 10:33:37
    9E:�書�エ研�告書
ctivity�eportEnglish4.doc

    E:書エ研告書 ctivityeportEnglish4.doc

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    Source URL: pfwww.kek.jp

    Language: English - Date: 2013-09-26 20:31:32
    10Photon Factory Activity Report 2006 #24 Part BChemistry 2C/2005S2-002  Thermal decomposition of LaAlO3/SiO2/Si gate stack structures studied by

    Photon Factory Activity Report 2006 #24 Part BChemistry 2C/2005S2-002 Thermal decomposition of LaAlO3/SiO2/Si gate stack structures studied by

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    Source URL: pfwww.kek.jp

    Language: English - Date: 2010-01-05 10:34:17