Sputtering

Results: 228



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51● Х и мия -мет а ллург ия ғ ылымда ры REFERENCES 1. Komarov L.F., Poletayeva M.A. Ispolzovanie vody na predpriyatiyakh i ochistka stochnykh vod v razlichnykh otraslyakh promyshlennosti: Uchebno

● Х и мия -мет а ллург ия ғ ылымда ры REFERENCES 1. Komarov L.F., Poletayeva M.A. Ispolzovanie vody na predpriyatiyakh i ochistka stochnykh vod v razlichnykh otraslyakh promyshlennosti: Uchebno

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Source URL: vestnik.kazntu.kz

Language: English - Date: 2015-04-08 06:33:25
52Centre for Advanced Research

Centre for Advanced Research

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Source URL: www.du.ac.bd

Language: English - Date: 2013-07-09 08:10:22
53Materials Science and Engineering A348 /89 www.elsevier.com/locate/msea Thermal behavior of supersolidus bronze powder compacts during heating by hollow cathode discharge C. Alves Jr. a,*, V. Hajek a, C.A. dos

Materials Science and Engineering A348 /89 www.elsevier.com/locate/msea Thermal behavior of supersolidus bronze powder compacts during heating by hollow cathode discharge C. Alves Jr. a,*, V. Hajek a, C.A. dos

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Source URL: www.if.ufrgs.br

Language: English - Date: 2003-08-08 10:06:00
54Microsoft Word - Advanced_Thin_Film.oral_historydoc

Microsoft Word - Advanced_Thin_Film.oral_historydoc

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Source URL: archive.computerhistory.org

Language: English - Date: 2006-09-27 15:03:38
55Pulsed Laser Deposition - Sputtering Module  Neocera is offering UHV compatible, advanced combination deposition tools integrating Pulsed Laser Deposition and Sputtering modules to create atomically clean, device quality

Pulsed Laser Deposition - Sputtering Module Neocera is offering UHV compatible, advanced combination deposition tools integrating Pulsed Laser Deposition and Sputtering modules to create atomically clean, device quality

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Source URL: www.neocera.com

Language: English - Date: 2013-01-04 14:35:53
56Surface and Interface  16A1/2002S2003 Analysis of X-ray reflectivity from sputtered carbon thin films (1) Consideration of density gradient

Surface and Interface 16A1/2002S2003 Analysis of X-ray reflectivity from sputtered carbon thin films (1) Consideration of density gradient

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:30:38
57Surface and Interface  15C/2002G197 Quantitative Analysis of Lattice Distortion due to Surface Treatment of Bias Sputtering by Extremely Asymmetric X-Ray Diffraction

Surface and Interface 15C/2002G197 Quantitative Analysis of Lattice Distortion due to Surface Treatment of Bias Sputtering by Extremely Asymmetric X-Ray Diffraction

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:30:27
58Photon Factory Activity Report 2005 #23 Part BElectronic Structure of Condensed Matter 18A/2004G002  In-situ depth profile resonant photoemission study of

Photon Factory Activity Report 2005 #23 Part BElectronic Structure of Condensed Matter 18A/2004G002 In-situ depth profile resonant photoemission study of

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:32:25
59Photon Factory Activity Report 2004 #22 Part BSurface and Interface 2C/2002S2-002  Interfacial reaction of polycrystalline-Si /HfO2/Si gate stacks with annealing

Photon Factory Activity Report 2004 #22 Part BSurface and Interface 2C/2002S2-002 Interfacial reaction of polycrystalline-Si /HfO2/Si gate stacks with annealing

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:31:28
60Photon Factory Activity Report 2006 #24 Part BSurface and Interface 7C, 9C, 12C, 13C/2005G242  Calculating area density of Hf atoms by transmit absorption spectra

Photon Factory Activity Report 2006 #24 Part BSurface and Interface 7C, 9C, 12C, 13C/2005G242 Calculating area density of Hf atoms by transmit absorption spectra

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:33:38